Title :
Measuring the impact of microarchitectural ideas
Author_Institution :
IBM Corp.
Abstract :
Welcome to IEEE Micro’s first issue of 2006. We are starting this year with our annual Top Picks issue. This is the third such annual collection of magazine-style adaptations of our top-rated papers selected from the past year’s computer architecture and design conferences.
Keywords :
IEEE Micro; Top Picks; microarchitecture; CMOS technology; Collaboration; Computer architecture; Delay; Microarchitecture; Microprocessor chips; Process design; Research and development; Semiconductor device measurement; System testing; IEEE Micro; Top Picks; microarchitecture;
Journal_Title :
Micro, IEEE
