A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs

Author

Monteiro, Conceição Líbano ; Arpaia, Pasquale ; Serra, António Cruz

Author_Institution

Dept. of Electr. & Comput. Eng., Tech. Univ. of Lisbon, Portugal

Volume

51

Issue

4

fYear

2002

fDate

8/1/2002 12:00:00 AM

Firstpage

756

Lastpage

763

Abstract

A phase-spectrum-based approach to the dynamic characterization of hysteretic analog-to-digital converters is proposed. Analytical relations between hysteresis of the dynamic transfer characteristic and out-of-phase components of the output Fourier spectrum are given. On this basis, an error model, a figure of merit, and a procedure for dynamic hysteresis testing are presented. Results of numerical characterization and experimental validation tests highlight the practical effectiveness of the proposed approach and its suitability for standardization.

Keywords

Fourier series; analogue-digital conversion; harmonic distortion; hysteresis; integrated circuit testing; signal sampling; spectral analysis; transfer functions; dynamic characterization; dynamic hysteresis testing; dynamic transfer characteristic; error model; figure of merit; hysteretic ADC; ideal transfer characteristic; metrological characterization; out-of-phase components; output Fourier spectrum; phase-spectrum-based approach; pipelined-flash digitizer; standardization; Analog-digital conversion; Histograms; Hysteresis; Impedance matching; Instruments; Proposals; Standardization; Standards; Testing; Transfer functions;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2002.803303

Filename

1044724