• DocumentCode
    856066
  • Title

    Opportunistic Transient-Fault Detection

  • Author

    Gomaa, Mohamed A. ; Vijaykumar, T.N.

  • Author_Institution
    Purdue Univ., West Lafayette, IN
  • Volume
    26
  • Issue
    1
  • fYear
    2006
  • Firstpage
    92
  • Lastpage
    99
  • Abstract
    CMOS scaling continues to enable faster transistors and lower supply voltage, improving microprocessor performance and reducing per-transistor power. The downside of scaling is increased susceptibility to soft errors due to strikes by cosmic particles and radiation from packaging materials. The result is degraded reliability in future commodity microprocessors. The authors target better coverage while incurring minimal performance degradation by opportunistically using redundancy
  • Keywords
    fault diagnosis; microprocessor chips; performance evaluation; power consumption; redundancy; CMOS scaling; microprocessor performance; minimal performance degradation; opportunistic transient-fault detection; per-transistor power reduction; redundancy; Computer errors; Costs; Degradation; Fault tolerant systems; Microprocessors; Power generation; Redundancy; Space missions; Voltage; Yarn; CMOS scaling; Transient-fault detection; redundancy; soft errors;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2006.20
  • Filename
    1603501
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=856066