DocumentCode
856225
Title
Efficacy of charge sharing in reshaping the surface electric field in high-voltage lateral RESURF devices
Author
Imam, Mohamed ; Quddus, Mohammed ; Adams, Jim ; Hossain, Zia
Author_Institution
ON Semicond., Phoenix, AZ, USA
Volume
51
Issue
1
fYear
2004
Firstpage
141
Lastpage
148
Abstract
A simple one-dimensional (1-D) analytical solution method for analyzing and determining the breakdown properties of reduced surface field (RESURF) lateral devices is presented. The solution demonstrates quantitatively and qualitatively the reshaping and reduction of the electric field and its dependence on the device/process key parameters. The solution is based on a simple and physical charge-sharing approach that takes into account the modulation of the lateral depletion layer spreading caused by the vertical depletion extension, and therefore transforms the inherent two-dimensional effects into a simple 1-D equivalent. It also provides a reasonable insight on the breakdown voltage sensitivity of lateral RESURF devices to key device/process parameters that other researchers failed to provide. Using the technique, device designers can set and choose the optimal processing window of the device´s critical layers to yield high breakdown voltages. The results obtained using the proposed solution method agree well with the experimental and simulation results.
Keywords
power MOSFET; semiconductor device breakdown; semiconductor device models; breakdown properties; breakdown voltage sensitivity; breakdown voltages; charge sharing; critical layers; electric field reduction; electric field reshaping; high-voltage lateral RESURF devices; lateral depletion layer; optimal processing window; physical charge-sharing; reduced surface field lateral devices; surface electric field; vertical depletion extension; Breakdown voltage; Costs; Design optimization; Electric breakdown; Logic devices; Monolithic integrated circuits; Power integrated circuits; Semiconductor device doping; Semiconductor diodes; Substrates;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2003.821383
Filename
1258157
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