• DocumentCode
    856527
  • Title

    MESAF: software for assessing the electromagnetic compatibility of complex systems

  • Author

    Davenport, E.M. ; Ellacott, D.C. ; Keen, A.G. ; Ogilvy, J.A.

  • Author_Institution
    Adv. Technol. Centre, BAE SYSTEMS, Filton, UK
  • Volume
    149
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    227
  • Lastpage
    231
  • Abstract
    The authors describe the development of software for the computation of electromagnetic field strengths in complex systems. The code MESAF (multilevel EMC system analysis framework) offers a different way to approach the analysis of EMC problems, particularly susceptibility. It occupies the intermediate level between ´back of the envelope´ calculations for simple geometries and the complexity of a full computational electromagnetics solution. It can also encompass the statistical variations found in real product geometries and layouts. Users are expected to be electromagnetic compatibility design engineers working in industry. The software is based on the concept of electromagnetic topology. The user defines the system electromagnetic topology, so precise geometrical details are not required, and the code then automatically generates the network of field ingress paths to a given unit in the system. A link to a transfer function database enables signal levels along these paths to be computed, so the susceptibility of the unit can be assessed. With MESAF it is possible to model the effect of design changes on the system susceptibility and to model products throughout the design cycle, with increasing accuracy as the design evolves.
  • Keywords
    electrical engineering computing; electromagnetic compatibility; software engineering; statistical analysis; transfer functions; MESAF; complex systems; computational electromagnetics solution; electromagnetic compatibility; electromagnetic field strength; electromagnetic system susceptibility; electromagnetic topology; field ingress paths; industry; multilevel EMC system analysis; product geometries; product layouts; software development; statistical variations; transfer function database;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20020589
  • Filename
    1044821