DocumentCode :
856721
Title :
[Advertisement]
Volume :
9
Issue :
5
fYear :
2008
Firstpage :
13
Lastpage :
13
Abstract :
Tired of endless iterations, tweaks, and redesign cycles? Wish you could modify or compact your layout and see the coupling effects on circuit performance instantaneously? With ACEtrade, AWR´s new automated circuit extraction technology, you can. ACE extracts layout-driven effects including coupling in multilayered RF modules and ICs - in seconds and stops the monotony of brute force EM analysis or schematic-driven manual fracturing techniques.
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; IC; automated circuit extraction technology; brute force EM analysis; circuit coupling effects; layout-driven effects; multilayered RF modules; schematic-driven manual fracturing techniques;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMW.2008.4622324
Filename :
4622324
Link To Document :
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