Measurement of domain wall energy and simulation of overwrite process on TbFeCo films

In order to analyze the direct thermomagnetic overwrite process, the domain wall energy, saturation induction, and coercivity for TbFeCo films were measured at high temperatures at which the recorded domains are formed. The domain wall energy was determined from an observation of stripe domains after AC demagnetization at elevated temperatures. Using the obtained parameters, a simulation was performed on an overwrite process with a fixed bias magnetic field for 100- and 200-nm-thick films. The simulation indicates that significant shrinkage of a prerecorded domain occurs for the 200-nm-thick film, which is consistent with previous observations