• DocumentCode
    856912
  • Title

    Measurement of domain wall energy and simulation of overwrite process on TbFeCo films

  • Author

    Hosoe, Yuzuru ; Suzuki, Yoshio ; Pfeffer, Nicola ; Okamine, Shigenori ; Ohta, Norio ; Suzuki, Ryo

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    1718
  • Lastpage
    1720
  • Abstract
    In order to analyze the direct thermomagnetic overwrite process, the domain wall energy, saturation induction, and coercivity for TbFeCo films were measured at high temperatures at which the recorded domains are formed. The domain wall energy was determined from an observation of stripe domains after AC demagnetization at elevated temperatures. Using the obtained parameters, a simulation was performed on an overwrite process with a fixed bias magnetic field for 100- and 200-nm-thick films. The simulation indicates that significant shrinkage of a prerecorded domain occurs for the 200-nm-thick film, which is consistent with previous observations
  • Keywords
    cobalt alloys; coercive force; iron alloys; magnetic domain walls; terbium alloys; thermomagnetic recording; 100 nm; 200 nm; AC demagnetization; TbFeCo films; coercivity; direct thermomagnetic overwrite process; domain wall energy; elevated temperatures; fixed bias magnetic field; high temperatures; prerecorded domain; recorded domains; saturation induction; shrinkage; stripe domains; Coercive force; Demagnetization; Energy measurement; Magnetic domain walls; Magnetic domains; Magnetic field measurement; Magnetic films; Saturation magnetization; Sputtering; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104503
  • Filename
    104503