DocumentCode
857503
Title
Spatially-resolved measurements of critical current density of superconducting films on 2 inch substrates
Author
Claassen, J.H.
Author_Institution
Naval Res. Lab., Washington, DC, USA
Volume
5
Issue
2
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
1413
Lastpage
1415
Abstract
An apparatus is described that makes non-invasive measurements of the critical current density at an array of 32 locations across a 2 inch diameter wafer. It operates at 77 K, and can resolve variations of a few percent. Measurements of the critical temperature of a single location on the film are also possible.<>
Keywords
barium compounds; critical current density (superconductivity); high-temperature superconductors; superconducting thin films; yttrium compounds; 2 in; 2 inch substrates; 77 K; YBa/sub 2/Cu/sub 3/O/sub 7/; critical current density; critical temperature; high temperature superconductor; spatially-resolved measurements; superconducting films; Circuits; Critical current; Critical current density; Current density; Current measurement; Density measurement; Power harmonic filters; Superconducting coils; Superconducting films; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.402829
Filename
402829
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