Title :
Damping-limited modulation bandwidths up to 40 GHz in undoped short-cavity In/sub 0.35/Ga/sub 0.65/As-GaAs multiple-quantum-well lasers
Author :
Weisser, S. ; Larkins, E.C. ; Czotscher, K. ; Benz, W. ; Daleiden, J. ; Esquivias, I. ; Fleissner, J. ; Ralston, J.D. ; Romero, B. ; Sah, R.E. ; Schonfelder, A. ; Rosenzweig, J.
Author_Institution :
Fraunhofer-Inst. fur Angewandte Festkorperphys., Freiburg, Germany
fDate :
5/1/1996 12:00:00 AM
Abstract :
We demonstrate record direct modulation bandwidths from MBE-grown In/sub 0.35/Ga/sub 0.65/As-GaAs multiple-quantum-well lasers with undoped active regions and with the upper and lower cladding layers grown at different growth temperatures. Short-cavity ridge waveguide lasers achieve CW direct modulation bandwidths up to 40 GHz for 6×130 μm2 devices at a bias current of 155 mA, which is the damping limit for this structure. We further demonstrate large-signal digital modulation up to 20 Gb/s (limited by the measurement setup) and linewidth enhancement factors of 1.4 at the lasing wavelength at threshold of /spl sim/1.1 μm for these devices.
Keywords :
damping; gallium arsenide; indium compounds; laser cavity resonators; laser transitions; molecular beam epitaxial growth; optical modulation; quantum well lasers; waveguide lasers; 1.1 mum; 155 mA; 40 GHz; In/sub 0.35/Ga/sub 0.65/As-GaAs; MBE-grown In/sub 0.35/Ga/sub 0.65/As-GaAs multiple-quantum-well lasers; bias current; continuous wave direct modulation bandwidths; damping limit; damping-limited modulation bandwidths; growth temperatures; large-signal digital modulation; lasing wavelength; linewidth enhancement factors; lower cladding layers; measurement setup; short-cavity ridge waveguide lasers; threshold; undoped active regions; undoped short-cavity In/sub 0.35/Ga/sub 0.65/As-GaAs multiple-quantum-well lasers; upper cladding layers; Bandwidth; Damping; Doping; Frequency; Gallium arsenide; Laser modes; Quantum well lasers; Semiconductor lasers; Temperature; Waveguide lasers;
Journal_Title :
Photonics Technology Letters, IEEE