• DocumentCode
    85789
  • Title

    Increasing Endurance and Security of Phase-Change Memory with Multi-Way Wear-Leveling

  • Author

    Hongliang Yu ; Yuyang Du

  • Author_Institution
    Comput. Sci. Dept., Tsinghua Univ., Beijing, China
  • Volume
    63
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1157
  • Lastpage
    1168
  • Abstract
    Phase-change memory (PCM) is a promising alternative of DRAM. Nonetheless, it has a well-known problem that is the limited number of writes to storage cells. Thus, wear-leveling, which makes the writes uniform, is crucial to boost PCM´s lifetime. This paper proposes multi-way wear leveling (MWWL) to increase both endurance and security of PCM. MWWL can efficiently distribute writes to physical addresses uniformly from a multiple of ways while incurring little write overhead and almost no extra hardware overhead. More important, MWWL is a fundamental scheme that can be applied to existing leveling algorithms. As a case study, we extended a state-of-the-art technique, Security Refresh, to its multi-way version, Multi-Way Security Refresh (MWSR). The experimental results show that MWSR can achieve the same or better lifetime than that of the original two-level Security Refresh but with much less write overhead (from 11.7% down to 1.5%).
  • Keywords
    DRAM chips; phase change memories; security of data; DRAM; MWSR; MWWL; PCM endurance; PCM lifetime; PCM security; leveling algorithms; multiway security refresh; multiway version; multiway wear leveling; phase change memory; storage cells; Ash; Hardware; Phase change materials; Phase change memory; Random access memory; Scalability; Security; Phase-change memory; endurance; lifetime; security; wear-leveling; write overhead;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2012.292
  • Filename
    6375706