Title :
Experimental evidence for electromagnetic coupling inhomogeneity along the grain boundary plane in high angle melt-textured YBa/sub 2/Cu/sub 3/O/sub 6+x/ bicrystals
Author :
Field, M.B. ; Pashitski, A. ; Polyanskii, A. ; Larbalestier, D.C. ; Parikh, A.S. ; Salama, K.
Author_Institution :
Appl. Supercond. Center, Wisconsin Univ., Madison, WI, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
Detailed characterization of two high angle general misorientation YBa/sub 2/Cu/sub 3/O/sub 6+x/ bicrystals produced by the melt-texture-liquid-phase-removal method shows that the boundaries contain regions of both strong and weak coupling. In one bicrystal the strongly coupled component was inferred from analysis of the magnetic-field-dependent voltage-current characteristics and confirmed with magneto-optical images of the boundary. Several sections of the second sample having macroscopically different grain boundary facets were tested after sectioning with a laser. The properties were not dependent on the grain boundary plane orientation. High-field, high-sensitivity voltage-current characteristics of the inter and intra-grain regions had qualitatively identical properties and confirmed that there was a substantial strong coupled component to the boundary. The data confirm that the melt-texture-liquid-phase-removal method of YBa/sub 2/Cu/sub 3/O/sub 6+x/ formation is beneficial to the formation of strong-coupling regions in high angle grain boundaries and that some high angle grain boundaries contain strongly coupled components.<>
Keywords :
barium compounds; bicrystals; grain boundaries; high-temperature superconductors; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 6+x/ bicrystals; YBa/sub 2/Cu/sub 3/O/sub 6/; electromagnetic coupling; high angle grain boundaries; laser sectioning; magnetic field; magneto-optical images; melt-texture-liquid-phase-removal; voltage-current characteristics; Bars; Electromagnetic coupling; Grain boundaries; Image analysis; Materials science and technology; Mechanical engineering; Superconductivity; Transistors; Voltage; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on