DocumentCode :
85827
Title :
See-Through Si Thin-Film Tandem Solar Cell Module With Hardener
Author :
Shoou-Jinn Chang ; Ching-In Wu ; Sheng-Po Chang
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
4
Issue :
4
fYear :
2014
fDate :
Jul-14
Firstpage :
1013
Lastpage :
1017
Abstract :
The authors propose an easy and cost-effective method for improving the reliability of see-through tandem modules. By adding hardener to the conventional see-through tandem modules, it was found that we could enhance the 1000-h-damp-heat-test degradation ratio from 82.64% to 89.6%, a near 7% enhancement. It was also found that the efficiency degraded only by 6.0% for the see-through tandem modules with hardener, after six IEC cycles. The smaller degradation ratio indicates that the see-through tandem modules with hardener were more reliable, as compared with the non-see-through tandem modules.
Keywords :
elemental semiconductors; semiconductor device reliability; semiconductor thin films; silicon; solar cells; IEC cycles; Si; damp-heat-test degradation ratio; hardener; see-through Si thin-film tandem solar cell module; see-through tandem module reliability; time 1000 h; Degradation; Educational institutions; IEC; Photovoltaic cells; Reliability; Silicon; Degradation; Si thin-film solar cells; hardener; module; see-through;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2014.2314573
Filename :
6802338
Link To Document :
بازگشت