858292

Carrier density fluctuation noise in field-effect transistors

van der Ziel, A.

51

11

1963

1670

1671

Charge carrier density; Circuit noise; Estimation error; FETs; Fluctuations; Maximum likelihood estimation; Monte Carlo methods; Random variables; Temperature; Writing;

English

Proceedings of the IEEE

ieee

0018-9219

jour

10.1109/PROC.1963.2659

1444589