Title :
Ultra-fast optical spectrum analyzer for DWDM applications
Author :
Campos, Juan Manuel ; Destrez, Alain ; Jacquet, Joël ; Toffano, Zeno
Author_Institution :
Service Radioelectricite, Ecole Superieure d´´Electricite (Supelec), Gif sur Yvette, France
Abstract :
Dense wavelength division multiplexing optical networks use tunable devices such as distributed Bragg reflector laser diodes. These optical sources require a precise wavelength calibration according to the ITU grid, even with aged components. Some specific optical spectrum analyzers are commercially available. Unfortunately, measurements using those systems are generally relatively slow. We present and discuss in this paper a fast spectral measurement system that can easily be implemented in a laser diode package.
Keywords :
Michelson interferometers; calibration; distributed Bragg reflector lasers; frequency measurement; laser tuning; laser variables measurement; light interferometry; optical testing; semiconductor device measurement; semiconductor lasers; spectral analysers; wavelength division multiplexing; 186 to 196 THz; DBR laser diodes; DWDM optical networks; ITU grid; Michelson interferometer; dense wavelength division multiplexing; distributed Bragg reflector laser diodes; frequency measurement; laser diode package; spectral measurement system; tunable laser diodes; two-wave optical interferometry; ultra-fast optical spectrum analyzer; wavelength calibration; Aging; Calibration; Diode lasers; Distributed Bragg reflectors; Optical devices; Optical fiber networks; Spectral analysis; Tunable circuits and devices; Wavelength division multiplexing; Wavelength measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.821507
