DocumentCode :
859054
Title :
Temperature and carrier injection-dependent characteristics of bulk unipolar (barrier) switches
Author :
Al-Bustani, A.
Author_Institution :
Sch. of Electr. & Electron. Eng., Lancashire Polytech., Preston
Volume :
24
Issue :
18
fYear :
1988
fDate :
9/1/1988 12:00:00 AM
Firstpage :
1185
Lastpage :
1187
Abstract :
The current/voltage characteristics of two-state homojunction barrier devices between 270 K and 330 K were investigated. Two new gated regenerative switching devices (the gated camel switch and the gated p plane barrier switch) and introduced for the first time. Carrier injection-dependent operational parameters, including switching voltage VSW, switching current density J SW, holding voltage VH and holding current density JH were studied. It is found that with increasing the injected electron or hole current density, VSW decreases while JSW increases. The two holding point parameters VH and JH remain constant over the carrier injection range. A comparison between theoretical and available experimental results is also presented
Keywords :
semiconductor device models; semiconductor switches; 270 to 330 C; barrier switches; bulk unipolar switches; carrier injection-dependent characteristics; current/voltage characteristics; experimental results; gated camel switch; gated p plane barrier switch; gated regenerative switching devices; holding current density; holding voltage; switching current density; switching voltage; temperature dependent characteristics; two-state homojunction barrier devices;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
Filename :
19624
Link To Document :
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