• DocumentCode
    859446
  • Title

    Relationships between processing temperature and microstructure in isothermal melt processed Bi-2212 thick films

  • Author

    Holesinger, T.G. ; Phillips, D.S. ; Willis, J.O. ; Peterson, D.E.

  • Author_Institution
    Supercond. Technol. Center, Los Alamos Nat. Lab., NM, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    1939
  • Lastpage
    1942
  • Abstract
    The microstructure and phase assemblage of isothermal melt processed (IMP) Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub y/ (Bi-2212) thick films have been evaluated. Results from compositional analysis and phase identification indicate that the characteristics of the partial melt greatly influence the microstructural and chemical development of the thick films. The highest critical current densities were obtained in films processed below 800/spl deg/C where the partial melt uniformly coats the substrate without excessive phase segregation.<>
  • Keywords
    barium compounds; calcium compounds; critical current density (superconductivity); crystal microstructure; high-temperature superconductors; powder technology; strontium compounds; thick films; 800 C; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub y/ thick films; chemical development; compositional analysis; critical current densities; high temperature superconductors; isothermal melt processed Bi-2212 thick films; microstructure; phase assemblage; phase identification; phase segregation; processing temperature; Critical current density; Government; Isothermal processes; Microstructure; Optical films; Phase measurement; Protection; Superconducting films; Temperature; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402963
  • Filename
    402963