• DocumentCode
    859499
  • Title

    Microwave measurement of conductivity and dielectric constant of semiconductors

  • Author

    Feucht, D.L.

  • Volume
    52
  • Issue
    1
  • fYear
    1964
  • Firstpage
    100
  • Lastpage
    100
  • Keywords
    Conductivity measurement; Dielectric constant; Dielectric measurements; Microwave measurements; Nonuniform electric fields; Propagation constant; Rectangular waveguides; Sampling methods; Semiconductor waveguides; Slabs;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.2778
  • Filename
    1444708
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=859499