859499

Microwave measurement of conductivity and dielectric constant of semiconductors

Feucht, D.L.

52

1

1964

100

100

Conductivity measurement; Dielectric constant; Dielectric measurements; Microwave measurements; Nonuniform electric fields; Propagation constant; Rectangular waveguides; Sampling methods; Semiconductor waveguides; Slabs;

English

Proceedings of the IEEE

ieee

0018-9219

jour

10.1109/PROC.1964.2778

1444708