Title :
A knowledge-based expert system for automatic visual VLSI reverse-engineering: VLSI layout version
Author :
Bourbakis, N.G. ; Mogzadeh, A. ; Mertoguno, S. ; Koutsougeras, C.
Author_Institution :
Dept. of Comput. Sci. & Eng., Wright State Univ., Dayton, OH, USA
fDate :
5/1/2002 12:00:00 AM
Abstract :
This paper presents a method of knowledge representation for very large scale integration (VLSI) chip design which provides the necessary information for abstraction from the physical design to gate-level logic through a high-level behavioral model. The representation scheme used by the ANTISTROFEAS system utilizes a hierarchical attributed graph structure which consists of incrementally abstracted design information for the VLSI system. This method of knowledge representation is well-suited to reverse-engineering of VLSI chips from the layer mask layout data, but is also applicable to applications at many levels of the design process including design rule checking, logic synthesis, design verification, and partitioning-compaction problems. The representation scheme is applicable to any VLSI technology, and is designed to take advantage of artificial intelligence. expert system techniques, by disassociating the representation and manipulation of the VLSI design data from the rules which govern its correctness and transformation for other usage.
Keywords :
VLSI; circuit layout CAD; expert systems; knowledge representation; logic CAD; reverse engineering; Antistrofeas system; VLSI layout version; artificial intelligence. expert system; automatic visual VLSI reverse engineering; design verification; gate-level logic; hierarchical attributed graph structure; high-level behavioral model; incrementally abstracted design information; knowledge representation; knowledge-based expert system; logic synthesis; partitioning-compaction problems; physical design; very large scale integration chip design; Artificial intelligence; Chip scale packaging; Expert systems; Knowledge representation; Logic design; Logic gates; Process design; Reverse engineering; Testing; Very large scale integration;
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
DOI :
10.1109/TSMCA.2002.805765