High J/sub c/ YBCO thick films prepared by LPE method

Author

Hirabayashi, I. ; Yoshida, M. ; Kitamura, T. ; Hyun, O.-B. ; Shiohara, Y. ; Tanaka, S. ; Tsuzuki, A. ; Sugawara, Y. ; Ikuhara, Y.

Author_Institution

Supercond. Res. Lab., ISTEC, Tokyo, Japan

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

2015

Lastpage

2018

Abstract

High-J/sub c/ YBa/sub 2/Cu/sub 3/O/sub y/ thick films were prepared by the liquid phase epitaxy (LPE) method. The growth rate was typically about 2 /spl mu/m/min, which was 10-10/sup 2/ times larger than that by conventional vapor growth techniques. The T/sub c/ of the best film exceeded 88 K after oxygen annealing, and the transport zero-field J/sub c/ was over 10/sup 5/ A/cm/sup 2/ at 77 K. The peak effect in J/sub c/-B characteristics was observed at several tesla by magnetic and transport measurements. Based on the micro-structure, the relevant peak effect is considered to be caused by stacking faults which act as a field induced pinning center.<>

Keywords

annealing; barium compounds; critical current density (superconductivity); crystal microstructure; flux pinning; high-temperature superconductors; liquid phase epitaxial growth; stacking faults; superconducting epitaxial layers; superconducting transition temperature; thick films; yttrium compounds; 77 K; 88 K; LPE method; O annealing; YBa/sub 2/Cu/sub 3/O; YBa/sub 2/Cu/sub 3/O/sub y/ thick films; critical current density; field induced pinning center; growth rate; high J/sub c/ thick films; high temperature superconductors; liquid phase epitaxy; magnetic measurements; microstructure; peak effect; stacking faults; superconducting transition temperature; transport measurements; transport zero-field; Atomic force microscopy; Magnetic films; Optical films; Optical microscopy; Scanning electron microscopy; Substrates; Superconducting films; Thick films; Transmission electron microscopy; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.402982

Filename

402982