• DocumentCode
    859754
  • Title

    Vacuum arc cathode spots as a self-similarity phenomenon

  • Author

    Schülke, T. ; Siemroth

  • Author_Institution
    Fraunhofer Inst. for Mater. Phys. & Thin Film Eng., Dresden, Germany
  • Volume
    24
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    63
  • Lastpage
    64
  • Abstract
    The determination of the basic physical parameters of vacuum arc cathode spots is very difficult due to their small dimensions and short existence times. Values given in the literature for the spot diameter range from less than 10 μm up to some hundred micrometers, and spot existence times vary from nanoseconds to some microseconds, caused by the use of different measuring techniques. Using specially designed optical equipment for emission photography, we found structures of cathode spot clusters (short exposure times) and cathode spot traces (long exposure times) which are similar on different spatial scales covering the range from hundreds of micrometers down to 10 μm. The light spot traces were found to be similar to scanning electron microscope (SEM) pictures of cathode spot craters, the latter having a higher spatial resolution. The self-similarity over three ranges of magnitude in spatial resolution shows the fractal nature of vacuum arc cathode spot traces
  • Keywords
    cathodes; photography; plasma diagnostics; vacuum arcs; cathode spot clusters; cathode spot craters; cathode spot traces; emission photography; light spot traces; scanning electron microscope pictures; self-similarity phenomenon; spatial resolution; specially designed optical equipment; spot diameter; spot existence times; vacuum arc cathode spots; Arc discharges; Cameras; Cathodes; Image resolution; Optical design; Photography; Scanning electron microscopy; Spatial resolution; Stimulated emission; Vacuum arcs;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.491692
  • Filename
    491692