Title :
Properties of YBaCuO thin film single-level dc SQUIDs fabricated using step-edge junctions
Author :
Sun, J.Z. ; Yu-Jahnes, L.S. ; Foglietti, V. ; Koch, R.H. ; Gallagher, W.J.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
A quantitative comparison study of single-level step-edge junction-based SQUIDs and bicrystal-substrate-based SQUIDs is given. Similar SQUID performance was found in terms of white flux noise level and junction-critical-current-related 1/f noise. Excess current was found in most step-edge devices. Issues related to systems applications, such as magnetic field-induced noise, junction cyclability upon repeated use, and environmental stability of oxide-metal contacts are also discussed.<>
Keywords :
1/f noise; SQUIDs; barium compounds; electron device manufacture; high-temperature superconductors; superconducting device noise; superconducting thin films; white noise; yttrium compounds; 1/f noise; YBaCuO; YBaCuO thin film single-level DC SQUIDs; bicrystal-substrate; critical-current; cyclability; environmental stability; fabrication; magnetic field; oxide-metal contacts; step-edge junctions; white flux noise; Fabrication; Low-frequency noise; Magnetic fields; Magnetic noise; Noise level; SQUIDs; Substrates; Transistors; Working environment noise; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
