DocumentCode :
859830
Title :
The microwave measurement of the complex permittivity of semiconductors
Author :
Gunn, M.W.
Volume :
52
Issue :
2
fYear :
1964
Firstpage :
185
Lastpage :
185
Keywords :
Absorption; Bleaching; Conductors; Dielectric constant; Dielectric measurements; Electrooptical waveguides; Length measurement; Microwave measurements; Permittivity measurement; Semiconductor waveguides;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.2809
Filename :
1444739
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=859830
