• DocumentCode
    860133
  • Title

    Negative differential resistance in InP JFETs

  • Author

    Kruppa, W. ; Boos, J. Brad

  • Author_Institution
    George Mason Univ., Fairfax, VA, USA
  • Volume
    25
  • Issue
    5
  • fYear
    1989
  • fDate
    3/2/1989 12:00:00 AM
  • Firstpage
    299
  • Lastpage
    301
  • Abstract
    Negative differential resistance, as evidenced by DC and microwave measurements, has been observed in InP JFETs for a range of channel geometries and bias values. These results, adjusted for possible substrate current, are shown to be consistent with the simple theory of stationary Gunn domain formation.
  • Keywords
    III-V semiconductors; indium compounds; junction gate field effect transistors; negative resistance; JFETs; bias values; channel geometries; microwave measurements; negative differential resistance; stationary Gunn domain formation; substrate current;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890209
  • Filename
    19727