• DocumentCode
    860139
  • Title

    Capture high-frequency partial inductance more accurately by gauss quadrature integration with skin-effect model

  • Author

    Du, Yu ; Dai, Wayne

  • Author_Institution
    Synopsys Inc., Mountain View, CA, USA
  • Volume
    54
  • Issue
    3
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    1287
  • Lastpage
    1294
  • Abstract
    Simulating the current distribution is the key to extracting equivalent frequency-dependent partial inductance and resistance for a very large scale integration circuit by integral-equation-based numerical methods. However, it is very difficult to calculate the current distribution and the electromagnetic (EM) field induced by the current due to skin effect and proximity effect at high frequency. In this paper, we propose a skin-effect model and view the current distribution as two parts, i.e., the skin-effect part and the smooth part. We use the current density at certain Gaussian points to approximate the total current and the EM field induced by it. This approach can achieve the highest algebra accuracy for the smooth part of the current distribution function with the same number of current density points, and experiments show that our method is more efficient and accurate than traditional piecewise-constant or piecewise-linear methods to extract frequency-dependent partial inductance and resistance.
  • Keywords
    Gaussian processes; VLSI; current density; current distribution; electromagnetic fields; integral equations; network analysis; proximity effect (superconductivity); skin effect; Gauss quadrature integration; algebra accuracy; current density; current distribution; electromagnetic field; integral-equation; parasite parameter extraction; piecewise-constant methods; piecewise-linear methods; proximity effect; skin effect model; very large scale integration circuit; Circuit simulation; Current density; Current distribution; Electromagnetic fields; Frequency; Gaussian processes; Inductance; Proximity effect; Skin effect; Very large scale integration; Gauss quadrature; inductance; parasite parameter extraction; skin effect;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.864096
  • Filename
    1603879