DocumentCode :
860180
Title :
Tuning Magnetic Microstructures of Reference Layer in Magnetic Tunneling Junctions
Author :
Yuan, L. ; Lin, Y.S. ; Wang, Dexin ; Liou, S.H.
Author_Institution :
Dept. of Phys. & Astron., Nebraska Univ., Lincoln, NE
Volume :
43
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
2788
Lastpage :
2790
Abstract :
Magnetic microstructures in the reference layer in magnetic tunneling junctions (MTJs) are tuned by a reversal field under ambient conditions to investigate their effects on the magnetoresistance (MR) and the exchange coupling field (HE) between the reference layer and the free layer. Magnetization changes in the reference layer can be probed by measuring minor MR loops. The results show the HE of the minor MR loops versus the applied reversal field changes from negative to positive and crosses zero. These results can be explained by the magnetic inhomogeneities at the interface between anti-ferromagnetic/pinned-ferromagnetic layers, which causes the partial magnetization reversal in the reference layer
Keywords :
alumina; antiferromagnetic materials; boron alloys; chromium alloys; cobalt alloys; exchange interactions (electron); ferromagnetic materials; iron alloys; magnetic domains; magnetic multilayers; magnetic structure; manganese alloys; micromagnetics; platinum alloys; ruthenium; ruthenium alloys; tantalum alloys; tunnelling magnetoresistance; MTJ free layer; Ru-CoFeB-RuTa-CoFeB-Al2O3 -CoFeB-Ru-FeCo-CrMnPt; TMR; antiferromagnetic-pinned-ferromagnetic layer interface; exchange coupling field; magnetic inhomogeneities; magnetic microstructures; magnetic tunneling junction reference layer; magnetization; magnetization reversal; minor magnetoresistance loops; multidomain formation; reversal field; tunneling magnetoresistance; Antiferromagnetic materials; Couplings; Magnetic devices; Magnetic field measurement; Magnetic heads; Magnetic materials; Magnetic separation; Magnetic tunneling; Magnetization; Micromagnetics; Exchange coupling; magnetic microstructure; magnetic tunneling junction;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2007.893691
Filename :
4202834
Link To Document :
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