DocumentCode
860384
Title
Effect of growth conditions on the electrical properties of Nb/Al-oxide/Nb tunnel junctions
Author
Mallison, W.H. ; Miller, R.E. ; Kleinsasser, A.W.
Volume
5
Issue
2
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
2330
Lastpage
2333
Abstract
We have investigated the dependence of the critical current density J/sub c/ of Nb/AlO/sub x//Nb Josephson tunnel junctions on substrate temperature T/sub s/ and oxygen exposure E (the product of oxidation time and pressure) during growth. For low O/sub 2/ exposures, J/sub c/ depended sensitively on exposure, J/sub c//spl prop/E/sup -1.6/, independent of temperature for 77 K>
Keywords
Josephson effect; aluminium compounds; critical current density (superconductivity); niobium; oxidation; 77 to 420 K; Nb-AlO-Nb; Nb/AlO/sub x//Nb Josephson tunnel junctions; critical current density; electrical properties; growth; oxidation; oxygen exposure; substrate temperature; Copper; Critical current density; Heat sinks; Heating; Josephson junctions; Niobium; Temperature sensors; Tensile stress; Thermal stresses; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.403052
Filename
403052
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