• DocumentCode
    860499
  • Title

    Comparison of large signal models for junction transistors

  • Author

    Hamilton, D.J. ; Lindholm, F.A ; Narud, J.A.

  • Author_Institution
    University of Arizona, Tucson, Ariz.
  • Volume
    52
  • Issue
    3
  • fYear
    1964
  • fDate
    3/1/1964 12:00:00 AM
  • Firstpage
    239
  • Lastpage
    248
  • Abstract
    The Ebers-Moll, charge control, and Linvill lumped models are systematically derived from a common mathematical origin. Approximations are discussed in detail, and the models are compared on the basis of their ability to represent physical processes, the ease with which they lend themselves to analysis, and the degree of approximation involved. It is shown that all three models are equivalent with regard to over-all degree of approximation, and therefore yield the same results in the solution of large-signal transient problems. However, the lumped model best portrays physical processes and lends itself most easily to intuitive understanding.
  • Keywords
    Design engineering; Laboratories; Mathematical model; Performance analysis; Semiconductor diodes; Solid state circuits; Sparks; Transient analysis; Transient response; Transistors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.2867
  • Filename
    1444797