• DocumentCode
    860560
  • Title

    Diffusion of impurities during epitaxy

  • Author

    Rice, Warren

  • Author_Institution
    Arizona State University, Tempe, Ariz.
  • Volume
    52
  • Issue
    3
  • fYear
    1964
  • fDate
    3/1/1964 12:00:00 AM
  • Firstpage
    284
  • Lastpage
    295
  • Abstract
    The diffusion of impurities in both epitaxial layers and the substrate is considered. The differential equations and boundary conditions which describe the problems are derived and solutions are presented for both the idealizations of a semi-infinite substrate and the true thickness of the substrate. Several types of boundary conditions are considered. For the cases of diffusion of impurities with the substrate considered as semi-infinite, the results from digital computation are given in tabular and graphical form. The method of application of the information to the design and production of epitaxial structures is indicated. A comparison is made between the solutions accounting for diffusion during epitaxy and solutions for a rationalized situation in which diffusion is computed by simpler means, and the simpler method is shown to be unsatisfactory for epitaxial calculations.
  • Keywords
    Atomic layer deposition; Boundary conditions; Conductivity; Epitaxial growth; Epitaxial layers; Germanium; Semiconductor impurities; Silicon; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.2871
  • Filename
    1444801