• DocumentCode
    860719
  • Title

    An improved pulse-line accelerator-driven, intense current-density, and high-brightness pseudospark electron beam

  • Author

    Zhu, Junbiao ; Wang, Zhijiang ; Zhang, Lifeng ; Wang, Mingchang

  • Author_Institution
    Inst. of Opt. & Fine Mech., Acad. Sinica, Shanghai, China
  • Volume
    24
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    A high-voltage (200 kV), high current-density, low-emittance (23π·mm mrd), high-brightness (8×1010 A/(mrd) 2) electron beam was generated in a pseudospark chamber filled with 15 Pa nitrogen and driven by a modified pulse line accelerator. The beam ejected with ⩽1-mm diameter, 2.2-kA beam current, 400-ns pulse length, and about 20 cm propagation distance. Exposure of 10 shots on the same film produced a hole of 1.6-mm diameter at 7 cm downstream of the anode, and showed its good reproducibility. After 60 shots, it was observed that almost no destructive damage traces were left on the surfaces of the various electrodes and insulators of the pseudospark discharge chamber. It was experimentally found that the quality of the pseudospark electron beam remains very high, even at high voltages (of several hundred kilovolts), similar to low voltages, and is much better than the quality of the cold-cathode electron beams
  • Keywords
    beam handling techniques; electron beams; electron sources; particle sources; sparks; 15 Pa; 2.2 kA; 200 kV; N2; anode; cold-cathode electron beams; high-brightness pseudospark electron beam; high-voltage; intense current-density electron beam; low-emittance; pseudospark chamber; pulse-line accelerator-driven electron beam; Acceleration; Anodes; Electrodes; Electron accelerators; Electron beams; Insulation; Nitrogen; Pulse generation; Reproducibility of results; Surface discharges;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.491754
  • Filename
    491754