Title :
A Simple Route to Fabricate Percolated Perpendicular Magnetic Recording Media
Author :
Rahman, M.Tofizur ; Lai, Chih-Huang ; Vokoun, D. ; Shams, Nazmun N.
Author_Institution :
Dept. of Material Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu
fDate :
6/1/2007 12:00:00 AM
Abstract :
A simple approach is proposed for fabrication of percolated perpendicular media (PPM). Nano pore array with pore diameter of 12-15 nm and different pore densities has been prepared by anodizing aluminum on silicon wafers. The pore density increases from 3.2times1010 cm-2 to 11.0times1010 cm-2 with the decrease in anodizing voltage from 30 to 10 V. Then, Pt (7 nm)/{Co (0.5 nm)/Pt (2) nm}5 multilayers are deposited onto this porous anodized alumina (AAO) by sputtering. The pore size is reduced to 10-12 nm after deposition of magnetic layers. The Co/Pt multilayers on AAO exhibit perpendicular magnetic anisotropy, squareness ratios of unity, and negative nucleation fields. The perpendicular coercivity increases linearly with the increase in pore density due to the pinning effect imposed by the pores, which is consistent with theoretical calculation for PPM
Keywords :
anodisation; cobalt; coercive force; magnetic multilayers; magnetic recording; nanostructured materials; nucleation; perpendicular magnetic anisotropy; platinum; sputter deposition; 0.5 nm; 2 nm; 7 nm; Co-Pt; Si-Al2O3; anodizing aluminum; anodizing voltage; magnetic layers; multilayers; nanopore array; negative nucleation fields; percolated perpendicular magnetic recording media; perpendicular coercivity; perpendicular magnetic anisotropy; pinning effect; pore densities; pore density; pore diameter; pore size; porous anodized alumina; silicon wafers; sputtering; squareness ratios; Aluminum; Coercive force; Fabrication; Magnetic anisotropy; Magnetic multilayers; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Silicon; Sputtering; Voltage; Anodized aluminum oxide (AAO); Co/Pt multilayers; percolated perpendicular media (PPM); pinning sites;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2007.893142