Title :
Looking for Shapes in Two-Dimensional Cluttered Point Clouds
Author :
Srivastava, Anuj ; Jermyn, Ian H.
Author_Institution :
Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
Abstract :
We study the problem of identifying shape classes in point clouds. These clouds contain sampled points along contours and are corrupted by clutter and observation noise. Taking an analysis-by-synthesis approach, we simulate high-probability configurations of sampled contours using models learned from training data to evaluate the given test data. To facilitate simulations, we develop statistical models for sources of (nuisance) variability: 1) shape variations within classes, 2) variability in sampling continuous curves, 3) pose and scale variability, 4) observation noise, and 5) points introduced by clutter. The variability in sampling closed curves into finite points is represented by positive diffeomorphisms of a unit circle. We derive probability models on these functions using their square-root forms and the Fisher-Rao metric. Using a Monte Carlo approach, we simulate configurations from a joint prior on the shape-sample space and compare them to the data using a likelihood function. Average likelihoods of simulated configurations lead to estimates of posterior probabilities of different classes and, hence, Bayesian classification.
Keywords :
Bayes methods; Monte Carlo methods; computational geometry; image classification; image sampling; learning (artificial intelligence); object recognition; probability; shape recognition; Bayesian classification; Fisher-Rao metric; Monte Carlo approach; analysis-by-synthesis approach; clutter rejection; continuous curve sampling; contour sampling; image object recognition; learning method; observation noise; pose variability; posterior probability model; scale variability; shape class identification; square-root form; statistical model; training data; two-dimensional cluttered point cloud; unit circle diffeomorphism; Bayesian inference; Curve sampling; Fisher-Rao metric; Shape classification; clutter model; cluttered point clouds; diffeomorphism.; diffeomorphisms; planar shape model; shape models; shape recognition; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2008.223