Electrical interface structure in YBa/sub 2/Cu/sub 3/O/sub 7-x//metal contact

Author

Terai, H. ; Fujimaki, A. ; Takai, Y. ; Hayakawa, H.

Author_Institution

Dept. of Electron., Nagoya Univ., Japan

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

2408

Lastpage

2411

Abstract

We have investigated the electrical contacts between YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) and Au. The dI/dV characteristics of the c-axis-oriented YBCO/Au/Nb junctions reveal the existence of a tunnel barrier at the YBCO/Au interface. The experimental results of the YBCO/LaGaO/sub 3//Au/Nb junction suggest p-type degenerate semiconductor-like behavior of YBCO along the c-axis direction. The anomalously small I/sub c/R/sub n/ of a few /spl mu/V in the c-axis direction are interpreted as the band bending at the YBCO surface. On the other hand, the experimental I/sub c/R/sub n/ value of 120 /spl mu/V in the a-axis-oriented YBCO/Au/Nb junction is understood within the scope of conventional theory.<>

Keywords

barium compounds; electrical contacts; gold; high-temperature superconductors; superconducting semiconductors; superconductive tunnelling; yttrium compounds; SNS junctions; YBCO/Au/Nb junction; YBCO/LaGaO/sub 3//Au/Nb junction; YBa/sub 2/Cu/sub 3/O/sub 7-x//metal contact; YBa/sub 2/Cu/sub 3/O/sub 7/-Au-Nb; YBa/sub 2/Cu/sub 3/O/sub 7/-LaGaO/sub 3/-Au-Nb; band bending; critical current normal resistance products; electrical interface structure; p-type degenerate semiconductor; tunnel barrier; Contacts; Electrons; Fabrication; Gold; Niobium; Proximity effect; Sputtering; Substrates; Temperature; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.403075

Filename

403075