DocumentCode
861020
Title
Physics-based RTD current-voltage equation
Author
Schulman, J.N. ; De Los Santos, H.J. ; Chow, D.H.
Author_Institution
Hughes Res. Labs., Malibu, CA, USA
Volume
17
Issue
5
fYear
1996
fDate
5/1/1996 12:00:00 AM
Firstpage
220
Lastpage
222
Abstract
An analytic expression for the current-voltage characteristics of resonant tunneling diodes is derived from basic principles. The form is ideal for insertion into circuit simulation models. It is demonstrated for a conventional InGaAs-AlAs RTD and for an InAs-AlSb-GaSb RIT diode. The expression is based on the quantum tunneling formalism and contains parameters that originate from physical quantities, but which can also be treated as empirical. Empirical fitting is straightforward and results in an excellent match to the data. Additional levels of physical realism can be incorporated in a natural way.
Keywords
resonant tunnelling diodes; semiconductor device models; I-V characteristics; InAs-AlSb-GaSb; InGaAs-AlAs; RIT diode; RTD current-voltage equation; circuit simulation models; physics-based I-V equation; quantum tunneling formalism; resonant tunneling diodes; Circuit simulation; Curve fitting; Digital circuits; Diodes; Equations; Fabrication; Predictive models; Resonance; Resonant tunneling devices; Temperature;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.491835
Filename
491835
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