• DocumentCode
    861020
  • Title

    Physics-based RTD current-voltage equation

  • Author

    Schulman, J.N. ; De Los Santos, H.J. ; Chow, D.H.

  • Author_Institution
    Hughes Res. Labs., Malibu, CA, USA
  • Volume
    17
  • Issue
    5
  • fYear
    1996
  • fDate
    5/1/1996 12:00:00 AM
  • Firstpage
    220
  • Lastpage
    222
  • Abstract
    An analytic expression for the current-voltage characteristics of resonant tunneling diodes is derived from basic principles. The form is ideal for insertion into circuit simulation models. It is demonstrated for a conventional InGaAs-AlAs RTD and for an InAs-AlSb-GaSb RIT diode. The expression is based on the quantum tunneling formalism and contains parameters that originate from physical quantities, but which can also be treated as empirical. Empirical fitting is straightforward and results in an excellent match to the data. Additional levels of physical realism can be incorporated in a natural way.
  • Keywords
    resonant tunnelling diodes; semiconductor device models; I-V characteristics; InAs-AlSb-GaSb; InGaAs-AlAs; RIT diode; RTD current-voltage equation; circuit simulation models; physics-based I-V equation; quantum tunneling formalism; resonant tunneling diodes; Circuit simulation; Curve fitting; Digital circuits; Diodes; Equations; Fabrication; Predictive models; Resonance; Resonant tunneling devices; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.491835
  • Filename
    491835