Title :
A novel multiple-valued logic gate using resonant tunneling devices
Author :
Waho, T. ; Chen, K.J. ; Yamamoto, M.
Author_Institution :
NTT LSI Labs., Kanagawa, Japan
fDate :
5/1/1996 12:00:00 AM
Abstract :
We demonstrate a novel multiple-valued logic (MVL) gate using series-connected resonant tunneling devices. Logic operation is based on the control of the switching sequence of these devices through the modulation of their peak currents by the input signal. We obtain the literal function, one of fundamental MVL functions, by integrating three InGaAs-based resonant-tunneling diodes with two HEMT´s on an InP substrate. The gate configuration is greatly simplified compared with a conventional literal gate employing CMOS circuits.
Keywords :
HEMT integrated circuits; field effect logic circuits; logic gates; multivalued logic circuits; resonant tunnelling diodes; HEMTs; InGaAs; InP; InP substrate; MVL gate; literal function; multiple-valued logic gate; peak current modulation; resonant tunneling devices; series-connected RTDs; switching sequence control; Circuits; HEMTs; Indium phosphide; Logic devices; Logic gates; Resonance; Resonant tunneling devices; Substrates; Switches; Voltage;
Journal_Title :
Electron Device Letters, IEEE