Title :
An image acquisition system based on state machine and sampling ADCs
Author :
Lima, Herman P., Jr. ; Barbosa, Ademarlaudo F. ; Guedes, Germano P. ; De Andrade Filho, Luciano M.
Author_Institution :
Detection Syst. Lab., Brazilian Center for Phys. Res. (CBPF), Rio de Janeiro, Brazil
fDate :
10/1/2002 12:00:00 AM
Abstract :
The present work reports on the development of a digital system for image acquisition which is able to process two electric signals of amplitude varying between 0 and 10 V. The system correlates both signals in a two-dimensional (2-D) histogram. X and Y coordinates for every event are obtained from the amplitudes of two coincident signals. The hardware consists of two analog-to-digital converters (ADCs), two complex programmable logic devices (CPLDs), and one 2 MB static random access memory (SRAM), implemented in a card that is plugged into personal computers. The data acquisition rate may be as high as 1.0 × 106 events per second, and does not depend on the PC processor. The software code has been written in the Delphi environment using assembly routines for the I/O bus operations. Image sizes may be chosen from 128 × 128 up to 1024 × 1024 pixels and may be viewed in color scale, with two or three-dimensional graphics. Images are shown to illustrate the applicability to two-dimensional position sensitive X-ray detectors.
Keywords :
SRAM chips; analogue-digital conversion; data acquisition; high energy physics instrumentation computing; nuclear electronics; position sensitive particle detectors; programmable logic devices; readout electronics; 2 MB; Delphi environment; I/O bus; SRAM; assembly routines; complex programmable logic devices; image acquisition system; sampling ADCs; software code; state machine; static random access memory; two-dimensional position sensitive X-ray detectors; Analog-digital conversion; Digital systems; Hardware; Histograms; Image sampling; Programmable logic devices; SRAM chips; Signal processing; Signal sampling; Two dimensional displays;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.803887