• DocumentCode
    861375
  • Title

    The use of force histograms for affine-invariant relative position description

  • Author

    Matsakis, Pascal ; Keller, James M. ; Sjahputera, Ozy ; Marjamaa, Jonathon

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Guelph Univ., Ont., Canada
  • Volume
    26
  • Issue
    1
  • fYear
    2004
  • fDate
    1/1/2004 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    18
  • Abstract
    Affine invariant descriptors have been widely used for recognition of objects regardless of their position, size, and orientation in space. Examples of color, texture, and shape descriptors abound in the literature. However, many tasks in computer vision require looking not only at single objects or regions in images but also at their spatial relationships. In an earlier work, we showed that the relative position of two objects can be quantitatively described by a histogram of forces. Here, we study how affine transformations affect this descriptor. The position of an object with respect to another changes when the objects are affine transformed. We analyze the link between: 1) the applied affinity, 2) the relative position before transformation (described through a force histogram), and 3) the relative position after transformation. We show that any two of these elements allow the third one to be recovered. Moreover, it is possible to determine whether (or how well) two relative positions are actually related through an affine transformation. If they are not, the affinity that best approximates the unknown transformation can be retrieved, and the quality of the approximation assessed.
  • Keywords
    computational geometry; computer vision; image matching; image texture; object recognition; affine invariant relative position description; affine transformations; color descriptors; computational geometry; computer vision; force histograms; image matching; object position; object recognition; shape descriptors; spatial relationships; texture descriptors; Cameras; Computer vision; Histograms; Layout; Low pass filters; Object recognition; Robustness; Shape; Spline;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2004.1261075
  • Filename
    1261075