• DocumentCode
    861460
  • Title

    80 M sample/s low powered, high resolution comparator in radiation hard SOI-BiCMOS technology

  • Author

    Wulleman, J.

  • Author_Institution
    Interuniv. Inst. for High Energies, Vrije Univ., Brussels
  • Volume
    32
  • Issue
    7
  • fYear
    1996
  • fDate
    3/28/1996 12:00:00 AM
  • Firstpage
    649
  • Lastpage
    651
  • Abstract
    This comparator is intended to be part of the front-end of a larger read-out chip to be used with particle detectors. Its demands are low power, high speed and a high resolution. The comparator is implemented in a radiation hard 0.8 μm SOI-SIMOX technology and offers us NMOS, PMOS, PJFET and NPN bipolar transistors plus two types of resistor and two types of capacitor. The comparator has a resolution of <500 μV, consumes 360 μW, is clocked at a fixed frequency of 40 MHz and has a sampling rate of 80 M sample/s
  • Keywords
    BiCMOS integrated circuits; SIMOX; comparators (circuits); nuclear electronics; particle detectors; radiation hardening (electronics); 0.8 micron; 360 muW; 40 MHz; SOI-SIMOX technology; Si; comparator; fixed frequency clock; particle detectors; radiation hard SOI-BiCMOS technology; resolution; sampling rate;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960443
  • Filename
    491877