DocumentCode :
861472
Title :
Effects of microstructures on microwave properties in Y-Ba-Cu-O microstrip-resonators
Author :
Yoshitake, T. ; Tsuge, H. ; Inui, T.
Author_Institution :
Fundamental Res. Labs., NEC Corp., Tsukuba, Japan
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
2571
Lastpage :
2574
Abstract :
We examined the microwave properties of YBa/sub 2/Cu/sub 3/O/sub x/ films with different microstructures at 5.7 GHz using a microstrip resonator technique. The films were prepared with several types of substrate temperature profiles. Films with small grains (/spl sim/100 nm) and larger critical current density show fairly small rf magnetic field dependence of surface resistance and resonance frequency up to about 50 Oe. On the other hand, films with large grains (/spl sim/200 nm) and smaller critical current density show significant changes in these properties. These results suggest that the coupling strength at the grain boundaries mainly dominates the power handling capability, according to a qualitative explanation based on the coupled-grain model.<>
Keywords :
barium compounds; critical current density (superconductivity); grain boundaries; high-temperature superconductors; microstrip resonators; superconducting device testing; superconducting microwave devices; superconducting resonators; superconducting thin films; yttrium compounds; 100 to 200 nm; 5.7 GHz; RF magnetic field; YBa/sub 2/Cu/sub 3/O; YBa/sub 2/Cu/sub 3/O/sub x/ films; coupled-grain model; coupling strength; critical current density; grain boundaries; grain size; microstrip-resonators; microstructures; microwave properties; power handling; resonance frequency; substrate temperature profiles; surface resistance; Critical current density; Magnetic fields; Magnetic films; Magnetic resonance; Microstrip resonators; Microstructure; Microwave theory and techniques; Surface resistance; Temperature; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.403115
Filename :
403115
Link To Document :
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