Thallium bromide optical and radiation detectors for X-ray and gamma-ray spectroscopy

Author

Hitomi, Keitaro ; Matsumoto, Manabu ; Muroi, Osamu ; Shoji, Tadayoshi ; Hiratate, Y.

Author_Institution

Dept. of Electron., Tohoku Inst. of Technol., Sendai, Japan

Volume

49

Issue

5

fYear

2002

fDate

10/1/2002 12:00:00 AM

Firstpage

2526

Lastpage

2529

Abstract

A compound semiconductor, thallium bromide (TlBr), has been investigated as an optical and radiation detector material for use in X- and γ-ray spectroscopy. Single crystals of TlBr have been grown by the traveling molten zone method using zone-purified materials. X- and γ-ray detectors have been fabricated from the TlBr crystals. The TlBr detectors have exhibited good spectrometric performances at room temperature. Polarization in TlBr detectors has been observed to deteriorate, detector performance. Optical detectors for scintillation spectroscopy have been fabricated from the crystals by depositing optically transparent electrodes of indium-tin-oxide (ITO) on the front surfaces of the crystals. The quantum efficiency of the TlBr optical detectors is high in the wavelength region below ∼460 nm, where the scintillation emissions of LSO and GSO occur.

Keywords

X-ray spectroscopy; gamma-ray spectroscopy; semiconductor counters; γ-ray spectroscopy; 460 nm; In-Sn-O; TlBr; TlBr detector; X-ray spectroscopy; optical detector; polarization; quantum efficiency; traveling molten zone method; Crystalline materials; Crystals; Gamma ray detection; Gamma ray detectors; Optical detectors; Optical materials; Radiation detectors; Semiconductor materials; Solid scintillation detectors; Spectroscopy;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2002.803851

Filename

1046780