• DocumentCode
    86163
  • Title

    Response Surface and Multiobjective Optimization Methodology for the Design of Compliant Interconnects

  • Author

    Wei Chen ; Sitaraman, Suresh K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    4
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    1769
  • Lastpage
    1777
  • Abstract
    Compliant off-chip interconnects have both in-plane and out-of-plane compliance and are able to accommodate the differential deflection between the die and the substrate or between the substrate and the board, and thus can enhance overall reliability and life of a microelectronic system. A TriDelta compliant interconnect is being pursued at Georgia Tech as an alternate die-to-substrate or substrate-to-board interconnect. It is found that any geometry improvement that enhances the mechanical compliance will also adversely affect the electrical performance. Thus, the design of a compliant interconnect is a tradeoff between the mechanical and electrical performances. In this paper, we examine eight design variables to balance mechanical and electrical performance metrics of a TriDelta interconnect. These design variables are appropriately reduced to four and normalized. The method of normalization not only reduces the number of the design variables but also makes the response surfaces scalable with footprint size. The response surfaces are constructed for electrical resistance, inductance, and the von Mises strains using the central composite inscribed design points. The method of global criterion is used to scalarize this multiobjective optimization problem, and an optimization has been done using specified design and processing constraints as well as the ranges of the design variables. Based on the optimization results, it is seen that the TriDelta compliant interconnect geometry can be designed to meet all of the electrical, mechanical, and fabrication requirements. The developed methodology is applicable to a wide range of other compliant interconnects beyond what is presented in this paper.
  • Keywords
    integrated circuit interconnections; integrated circuit packaging; optimisation; response surface methodology; TriDelta compliant interconnect geometry; central composite; compliant off-chip interconnects; electrical performance metrics; electrical resistance; inductance; mechanical performance metrics; multiobjective optimization methodology; response surface methodology; von Mises strains; Copper; Inductance; Response surface methodology; Strain; Substrates; Surface resistance; Compliant interconnect; design optimization; microelectronic packaging; response surface methodology;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2357762
  • Filename
    6910260