• DocumentCode
    861688
  • Title

    GaN HEMT Potential for Low-Noise Highly Linear RF Applications

  • Author

    Khalil, I. ; Liero, A. ; Rudolph, M. ; Lossy, R. ; Heinrich, W.

  • Author_Institution
    Ferdinand-Braun-Inst., Berlin
  • Volume
    18
  • Issue
    9
  • fYear
    2008
  • Firstpage
    605
  • Lastpage
    607
  • Abstract
    This paper presents a study of the capability of gallium-nitride (GaN) high-electron mobility transistors (HEMTs) to achieve low noise and high linearity performance. A packaged GaN HEMT was measured in a 50 - Omega system at 2 GHz. Noise figures slightly above 1.8 dB were achieved together with a record third-order intercept point of 54 dBm. The same configuration yields a maximum output power of 30 W, with 50% power-added efficiency. This combination of high power and low-noise performance allows the realization of highly linear low-noise amplifiers, which could significantly reduce protection and filter efforts at receiver inputs.
  • Keywords
    III-V semiconductors; MMIC; gallium compounds; high electron mobility transistors; low noise amplifiers; semiconductor device noise; wide band gap semiconductors; GaN; amplifier distortion; amplifier noise; cross modulation distortion; frequency 2 GHz; gallium-nitride high-electron mobility transistors; intermodulation distortion; linear low-noise amplifiers; microwave power field-effect transistor amplifiers; power 30 W; semiconductor device noise; Gallium nitride; HEMTs; Linearity; Low-noise amplifiers; MODFETs; Noise figure; Packaging; Power amplifiers; Power generation; Radio frequency; Amplifier distortion; amplifier noise; cross modulation distortion; distortion; intermodulation distortion (IMD); microwave power field-effect transistor (FET) amplifiers; semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2008.2002458
  • Filename
    4624621