DocumentCode :
861708
Title :
Probing active systems statistically for faults
Author :
Wolf, A.A.
Volume :
52
Issue :
4
fYear :
1964
fDate :
4/1/1964 12:00:00 AM
Firstpage :
443
Lastpage :
444
Keywords :
Circuit faults; Coupling circuits; Dielectric substrates; Electron beams; Geometrical optics; Optical coupling; Optical modulation; Optical waveguides; Parameter estimation; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.2978
Filename :
1444908
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=861708
