DocumentCode :
861718
Title :
Measurement of noise in image orthicon
Author :
Odagawa, K.
Volume :
52
Issue :
4
fYear :
1964
fDate :
4/1/1964 12:00:00 AM
Firstpage :
445
Lastpage :
445
Keywords :
Circuit noise; Diodes; Electrical resistance measurement; Frequency measurement; Lighting; Noise measurement; Pulse measurements; Signal to noise ratio; Silicon compounds; TV;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.2979
Filename :
1444909
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=861718
