Title :
Phase-locking of stacked all-niobium junction arrays to external rf-irradiation
Author :
Klushin, A.M. ; Kohlstedt, H. ; Niemeyer, J.
Author_Institution :
Inst. fur Schicht- und Ionentechnik, Forschungszentrum Julich GmbH, Germany
fDate :
6/1/1995 12:00:00 AM
Abstract :
We have experimentally investigated the range of locking to external rf-bias current for large 3D arrays. Up to 2000 series connected stacks with two junctions in a stack and 84 series connected stacks with four junctions in a stack were incorporated into a microstripline. Our measurement showed a drastic reduction of the phase locking range with an increasing number of junctions in an individual stack of the array. We investigated the dependence of the attenuation in the microstripline for different numbers of junctions in a stack. In addition, the attenuation of the rf current in the neighboring junctions in a stack was measured.<>
Keywords :
Josephson effect; aluminium; aluminium compounds; critical currents; microstrip lines; niobium; superconducting device testing; superconducting junction devices; superconducting microwave devices; 22 to 31 GHz; Nb-Al-AlO-Nb; Nb-Al/AlO/sub x/-Nb stacked tunnel junction; RF current attenuation; Shapiro step height; critical current spread; external RF-bias current; external microwave irradiation; large 3D arrays; microstripline; phase locking range; series connected stacks; stacked all-Nb junction arrays; Attenuation measurement; Critical current; Current measurement; Josephson junctions; Microstrip; Microwave measurements; Phase measurement; Phased arrays; Power measurement; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
