Title :
A cryogenic scanning laser microscope for investigation of dynamical states in long Josephson junctions
Author :
Helm, Joseph ; Mygind, J.
Author_Institution :
Phys. Dept., Tech. Univ. Denmark, Lyngby, Denmark
fDate :
6/1/1995 12:00:00 AM
Abstract :
The first local oscillators based on moving magnetic flux quanta in long Josephson junctions are being developed for superconducting integrated quasi-optical SIS receivers. In order to further refine these oscillators one has to understand the complex dynamics of these devices. Since the local tunnel current is one of the most important internal junction parameters which together with the boundary conditions determine the dynamics, it is of vital importance to experimentally determine the current density throughout the entire junction with high spatial resolution. Here we report on measurements on different oscillator samples, performed with a novel Cryogenic Scanning Laser Microscope (CSLM) having a spatial resolution of less than /spl plusmn/2.5 /spl mu/m over a 500 /spl mu/m/spl times/50 /spl mu/m wide scanning area in the temperature range 2 K-300 K. Even though the dynamical states are extremely sensitive to external noise this microscope enables us to make stable in-situ measurements on operating Josephson junctions. Recent results are presented and discussed.<>
Keywords :
Josephson effect; critical current density (superconductivity); cryogenics; flux flow; low-temperature techniques; optical microscopes; submillimetre wave oscillators; superconducting device testing; 2 to 300 K; boundary conditions; cryogenic scanning laser microscope; current density; dynamical states; external noise sensitivity; gap state; high spatial resolution; internal junction parameters; local oscillators; local tunnel current; long Josephson junctions; moving magnetic flux quanta; quasiparticle distribution; stable in-situ measurements; superconducting integrated quasi-optical SIS receivers; Area measurement; Boundary conditions; Cryogenics; Josephson junctions; Local oscillators; Magnetic flux; Microscopy; Noise measurement; Spatial resolution; Superconducting devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on