Design and testing of high-T/sub c/ Josephson pulse driver using selective SEJs

Author

Umezawa, T. ; Higashino, Y.

Author_Institution

TERATEC Corp., Tokyo, Japan

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

2809

Lastpage

2812

Abstract

We have designed a novel Josephson pulse driver based on SFQ circuits using high-T/sub c/ junction parameters, and fabricated it using selective SEJs. Simulation showed that the output pulse can be stepped up to 2.5 mV, which is 13 times larger amplitude than the input pulse. In the fabricated driver using a microstrip line, two dozen SEJs were integrated with Au resistors and inductors. The driver operated at 77 K with a conversion factor of (1-1.5) at best.<>

Keywords

barium compounds; driver circuits; dysprosium compounds; high-temperature superconductors; pulse circuits; superconducting device testing; superconducting integrated circuits; superconducting microbridges; 2.5 mV; 77 K; Au; Au resistors; DyBaCuO; DyBaCuO film; Josephson driver fabrication; Josephson driver testing; MBE growth; MgO; MgO substrate; SFQ circuits; conversion factor; high-T/sub c/ Josephson pulse driver; high-T/sub c/ junction parameters; inductors; microbridge; microstrip line; output pulse stepping; selective SEJs; simulation; Etching; Magnetic fields; Molecular beam epitaxial growth; Plasma applications; Plasma properties; Plasma temperature; Resists; Shape; Substrates; Testing;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.403175

Filename

403175