Title :
Design and testing of high-T/sub c/ Josephson pulse driver using selective SEJs
Author :
Umezawa, T. ; Higashino, Y.
Author_Institution :
TERATEC Corp., Tokyo, Japan
fDate :
6/1/1995 12:00:00 AM
Abstract :
We have designed a novel Josephson pulse driver based on SFQ circuits using high-T/sub c/ junction parameters, and fabricated it using selective SEJs. Simulation showed that the output pulse can be stepped up to 2.5 mV, which is 13 times larger amplitude than the input pulse. In the fabricated driver using a microstrip line, two dozen SEJs were integrated with Au resistors and inductors. The driver operated at 77 K with a conversion factor of (1-1.5) at best.<>
Keywords :
barium compounds; driver circuits; dysprosium compounds; high-temperature superconductors; pulse circuits; superconducting device testing; superconducting integrated circuits; superconducting microbridges; 2.5 mV; 77 K; Au; Au resistors; DyBaCuO; DyBaCuO film; Josephson driver fabrication; Josephson driver testing; MBE growth; MgO; MgO substrate; SFQ circuits; conversion factor; high-T/sub c/ Josephson pulse driver; high-T/sub c/ junction parameters; inductors; microbridge; microstrip line; output pulse stepping; selective SEJs; simulation; Etching; Magnetic fields; Molecular beam epitaxial growth; Plasma applications; Plasma properties; Plasma temperature; Resists; Shape; Substrates; Testing;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
