Title :
Low-jitter multi-phase digital DLL with closest edge selection scheme for DDR memory interface
Author :
Oh, K.-I. ; Kim, Lee-Sup ; Park, K.-I. ; Jun, Young-Hyun ; Kim, Kunsu
Author_Institution :
Dept. of EECS, KAIST, Daejeon
Abstract :
A multi-phase digital delay-locked loop (DLL) capable of a low-jitter feature for DDR memory interface is reported. The DLL repeatedly selects the output clock edge which is closest to the reference clock edge to reduce the total jitter. A test chip was fabricated in a 0.18 m CMOS process to verify its functionality. The measured RMS and peak-to-peak jitter of the DLL are 6.2 and 20.4 ps, respectively. The power consumption of the DLL is 12 mW from a 1.8 V supply voltage.
Keywords :
CMOS memory circuits; clocks; delay lock loops; jitter; CMOS process; DDR memory interface; DLL; chip fabrication; edge selection scheme; low-jitter multiphase digital DLL; power 12 mW; size 0.18 mum; voltage 1.8 V;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20081833