Title :
On the validity of the Boltzmann boundary conditions at semiconductor interfaces
Author :
Lade, R.W. ; Poncelet, C.G.
fDate :
5/1/1964 12:00:00 AM
Keywords :
Boundary conditions; Charge carrier density; Charge carrier processes; Lighting; Microwave measurements; Pulse measurements; Semiconductor device doping; Space charge; Statistics; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1964.3028
