• DocumentCode
    862325
  • Title

    Electric field effect in Sm/sub 1-x/Ca/sub x/Ba/sub 2/Cu/sub 3/O/sub y/ bicrystal junctions

  • Author

    Dong, Z.W. ; Matijasevic, V.C. ; Hadley, P. ; Shao, S.M. ; Mooij, J.E.

  • Author_Institution
    Inst. for Microelectron. & Submicron Technol., Delft Univ. of Technol., Netherlands
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    2879
  • Lastpage
    2882
  • Abstract
    A three terminal device was fabricated by depositing a thin film of Ca-doped SmBa/sub 2/Cu/sub 3/O/sub y/ on a bicrystal SrTiO/sub 3/ substrate and then structuring a gate over the resulting junction. The channel shows RSJ-like Josephson junction behavior. By applying a voltage to the gate, a large electric field effect was observed. The largest field effect was observed in films where 30% of the Sm was replaced by Ca. The critical current of the junction was modulated 23% by the application of an electric field of 5/spl times/10/sup 5/ V/cm. This electric field is about 100 times smaller than the electric field necessary for the field effects observed in homogeneous films. The sign of the field effect is consistent with that expected for a carrier-depleted grain boundary region.<>
  • Keywords
    Josephson effect; barium compounds; bicrystals; calcium compounds; electric field effects; high-temperature superconductors; samarium compounds; superconducting thin films; Ca-doped SmBa/sub 2/Cu/sub 3/O/sub y/; RSJ-like Josephson junction; Sm/sub 1-x/Ca/sub x/Ba/sub 2/Cu/sub 3/O/sub y/ bicrystal junctions; SmCaBa/sub 2/Cu/sub 3/O-SrTiO/sub 3/; SrTiO/sub 3/ substrate; carrier-depleted grain boundary; critical current; electric field; thin film; three terminal device; Electrodes; Grain boundaries; Physics; Samarium; Sputtering; Superconducting films; Superconducting materials; Superconductivity; Voltage; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.403193
  • Filename
    403193