Title :
Effects of strain on the high speed modulation of GaAs- and InP-based quantum-well lasers
Author :
Lam, Yeeloy ; Loehr, John P. ; Singh, Jasprit
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
1/1/1993 12:00:00 AM
Abstract :
A small-signal numerical analysis of pseudomorphic GaAs- and InP-based Fabry-Perot quantum-well lasers using calculated optical gain spectra with strain effects included is reported. Examination of the effect of lifetime broadening shows that the resonance frequency increases at a rate of ~250-MHz/meV reduction in the lifetime broadening for a GaAs-based strained layer laser. The modulation speed is limited by either device heating or facet damage. If the limitation is imposed by the optical power then the modulation speed increases as the laser cavity becomes shorter and the number of quantum wells increases. If the limitation is imposed by the injection current density, however, then the modulation speed decreases for the laser with shorter cavity length. The highest modulation speed is given by an optimum well number. A resonance frequency of ~16 GHz is predicted for a pseudomorphic GaAs-based laser with 30% excess In and average output power of ~5 mW
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; laser theory; optical modulation; semiconductor lasers; 16 GHz; 5 mW; Fabry-Perot quantum-well lasers; GaAs; GaAs- based quantum-well lasers; InP; InP-based quantum-well lasers; calculated optical gain spectra; device heating; facet damage; high speed modulation; injection current density; laser cavity; lifetime broadening; modulation speed; optical power; optimum well number; pseudomorphic; quantum well number; resonance frequency; semiconductors; small-signal numerical analysis; strain effects; strained layer laser; Capacitive sensors; Fabry-Perot; Heating; High speed optical techniques; Numerical analysis; Optical modulation; Power lasers; Quantum well lasers; Resonance; Resonant frequency;
Journal_Title :
Quantum Electronics, IEEE Journal of